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Title:
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Microwave detection of minority carriers in solar cells siliconwavers
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Author(s):
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Published by:
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Publication date:
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ECN
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1995
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ECN report number:
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Document type:
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ECN-RX--95-054
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Other
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Number of pages:
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Full text:
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19
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Download PDF
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Abstract:
Techniques measuring photoconductive decay by means of microwaves(mu-PCD) can be used to detect free carriers in semiconductors. The
instrument as developed at ECN for characterization of the solar cell
material is described. The experimental details of two measurement techniques
and the theoretical background are discussed. In the decay method the
effective mean lifetime of the minority carriers is measured. In the harmonic
modulation technique information about the lifetime of the minorities is
contained in the phase-shift of the microwave signal relative to the phase of
the light intensity. The aim of this research is to determine the bulk mean
lifetime of the minority carriers and the surface recombination velocities of
solar cell silicon wafers by a non-destructive and contactless technique.
Typical experiments will be presented. 8 figs., 11 refs.
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