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Title:
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Results of five solar silicon wafer minority carrier lifetime round robins organised by the semi M6 solar silicon standardisation task force
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Author(s):
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Published by:
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Publication date:
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ECN
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1997
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ECN report number:
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Document type:
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ECN-RX--97-024
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Article (scientific)
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Number of pages:
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8
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Published in: Paper, presented at the 14th European photovoltaic solar energy conference and exhibition, 30 June - 4 July, Barcelona, Spain (), , , Vol., p.-.
Abstract:
Within the framework of the SEMI (Semiconductor Equipment and MaterialsInternational) standardization activities the SEMI M6-85 'Specifications for
silicon wafers for use in photovoltaic solar cells' is revised by a voluntary
European task force. Among other specifications, which describe the material,
the minority carrier lifetime or diffusion length plays an important role. It
is expected that there is a strong correlation between minority carrier
lifetime and solar cell efficiency and that the knowledge of the carrier
lifetime can be used to predict the cell efficiency. This statement, although
nearly as old as the solar cell industry, could not be proven in general as
there is still no lifetime measurement technique available which produces
comparable and reliable results. To find a solution to this problem and to
develop such a standard lifetime measurement procedure for crystalline
silicon solar material is the major target of the SEMI M6 group activities. 8
figs., 1 tab., 33 refs.
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