|
Title:
|
|
Microstructure characterization of titanium dioxide nanodispersions and thin films for dye-sensitized solar cell devices
|
|
|
|
Author(s):
|
Deelen, J. van; Kroon, J.M.; Almeida, P. de; Catry, C.; Sneyers, H.; Pataki, T.; Andriessen, R.; Roost, C. van
|
|
|
|
Published by:
|
Publication date:
|
|
ECN
Solar Energy
|
1-11-2004
|
|
|
|
ECN report number:
|
Document type:
|
|
ECN-RX--04-116
|
Article (scientific)
|
|
|
|
Number of pages:
|
|
|
10
|
|
Published in: Applied Physics A 79, 1819-1828 (2004) (Springer), , , Vol., p.-.
Abstract:
This article reports on the microstructure characterization of titaniumdioxide nanodispersions and thin films made thereof for dye-sensitized
solar cell devices. Structure-property relationships have been investigated
mainly using electron microscopy to assess how microstructure (crystalline
structure, defects) and morphological (e.g. heterogeneiteis, inclusions,
voids) features in the electron transport element of the solar cell
device correlate with electrical performance, namely, short-circuit
photocurrent density (Jsc). This work shows that for a nanodispersion
synthesied in the laboratory different electrical performances ae measureable
depending on the thin film forming process, more specifically, heat-sintering
at 450 degrees Celsius or pressure-sintering at 500 bar. Dor the heat-sintered
one this device Jsc is about 7.3 mA/cm2 whereas for the pressure-sintered
one this value is much lower, this difference being attributed to the
existence of inclusions in the titanium dioxide matrix, which are spatially
isolated from the rest of the electron transport element thereby limiting
the charge transport process by promoting their premature recombination.
Back to List