ECN publication
Title:
Optimizing metalization patterns for yearly yield
 
Author(s):
 
Published by: Publication date:
ECN Solar Energy 1997
 
ECN report number: Document type:
ECN-RX--97-061 Article (scientific)
 
Number of pages:
6  

Published in: Paper, presented at the 26th IEEE photovoltaic specialists' conference, September 29- October 3, 1997, Anaheim, California, USA (), , , Vol., p.-.

Abstract:
Normally, solar cells are optimized for maximum efficiency at standardtest conditions. It is recognized ever more widely that cells and modules should be optimized for maximum yield at their operating conditions. The metallization pattern is one aspect of this optimization. An optimized pattern can be implemented at no cost in, for instance, the case of screen-printed solar cells, as it merely requires changing the screen printing mask. It is demonstrated that most H-grid metallization programs can be used without any modification for optimization for yearly yield. Then this method is used to optimize for both yearly yield for irradiation conditions as they occur in the Netherlands and standard test conditions. It turns out that yearly optimization can be realized at fewer bus bars and a much lower number of fingers. The total yield is improved by .1 %. 6 figs., 5 tabs., 6 refs.


Back to List