ECN publication
Title:
Shunt detection in solar cells with the Corescanner and lock-in thermography : a comparison
 
Author(s):
Heide, A.S.H. van der; Breitenstein, O.; Rakotoniaina, J.P.
 
Published by: Publication date:
ECN Solar Energy 1-8-2001
 
ECN report number: Document type:
ECN-RX--01-048 Conference Paper
 
Number of pages: Full text:
4 Download PDF  

Presented at: 11th Workshop on Crystalline Silicon Solar Cell Materials and Processes, Ester Park CO, USA, 19-22 augustus 2001.

Abstract:
The Corescanner has been recently introduced as a simple and cheap instrument to map COntact REsistance of the front side metallisation. Additionally, the Corescanner may be used to localize shunts according to the Parallel Resistance Analysis by Mapping of Potential method (PRAMP). Until now shunts have been imaged most clearly using infrared (IR) lock-in thermography, which is quite an expensive technique. In this contribution PRAMP and lock-in thermography are directly compared by investigating an identical sample. It turned out that the sensitivity of PRAMP is not as high as that of lock-in thermography, and PRAMP cannot detect shunts below metallisation, in contrary to lock-in thermography. These conclusions show that the Corescanner is suited for solving most processing problems causing strong local shunts, whereas the lock-in thermography is best for a complete determination of all shunts.


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