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Title:
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Reliability results for high-efficiency foil-based back-contact PV modules
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Author(s):
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Published by:
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Publication date:
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ECN
Solar Energy
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14-9-2015
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ECN report number:
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Document type:
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ECN-M--15-043
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Conference Paper
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Number of pages:
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Full text:
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4
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Download PDF
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Abstract:
In this paper we have presented an overview of the recent reliability results obtained at ECN for foil-based p-MWT, and novel high-efficiency n-MWT and IBC back-contact modules. As deduced from extensive TC and DH testing on p-MWT modules, two alternative low-cost conductive back sheet foils were shown to improve the module reliability. Exposure to DH of the foil-based modules can cause Cu discoloration. This is observed for EVA and a number of alternative encapsulants, with moisture ingress and some specific interactions between encapsulant and Cu substrate playing a role. The n-MWT modules showed improved resistance to DH exposure as compared to n-Pasha (front-to-back tabbing) modules. TC300 and DH2000 tests were passed for frameless IBC Mercury 2x2 modules built using standard foil-based module manufacture process and standard module materials.
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