|
Title:
|
|
Investigation of series resistance losses by illuminated lock-in thermography
|
|
|
|
Author(s):
|
|
|
|
|
|
Published by:
|
Publication date:
|
|
ECN
Solar Energy
|
1-10-2000
|
|
|
|
ECN report number:
|
Document type:
|
|
ECN-RX--05-032
|
Article (scientific)
|
|
|
|
Number of pages:
|
|
|
7
|
|
Published in: Progress in Photovoltaics: Research and Applications (John Wiley & Sons Ltd.), , 2005, Vol.13, p.697-703.
Abstract:
A measurement mode (J
SC-ILIT) for the recently introduced
Illuminated Lock-In Thermography (ILIT) method and a new interpretation
of the images obtained is proposed. This mode is especially adapted
for the investigation of series resistance, in particular contact resistance,
in solar cells. Comparison of JSC-ILIT
results to emitter potential maps obtained by Corescan demonstrate good
agreement between the poorly contacted areas, proving the practical
applicability of the technique. JSC-ILIT
provides a quasi-contactless and fast measurement. Comparison is made
with the recently introduced method of RS-ILIT. The capability of both methods to detect series
resistance problems is demonstrated. Possible distortions due to inhomogeneities
of bulk material quality are discussed.
Back to List