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Title:
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Optimizing metalization patterns for yearly yield
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Author(s):
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Published by:
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Publication date:
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ECN
Solar Energy
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1997
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ECN report number:
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Document type:
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ECN-RX--97-061
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Article (scientific)
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Number of pages:
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6
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Published in: Paper, presented at the 26th IEEE photovoltaic specialists' conference, September 29- October 3, 1997, Anaheim, California, USA (), , , Vol., p.-.
Abstract:
Normally, solar cells are optimized for maximum efficiency at standardtest conditions. It is recognized ever more widely that cells and modules
should be optimized for maximum yield at their operating conditions. The
metallization pattern is one aspect of this optimization. An optimized
pattern can be implemented at no cost in, for instance, the case of
screen-printed solar cells, as it merely requires changing the screen
printing mask. It is demonstrated that most H-grid metallization programs can
be used without any modification for optimization for yearly yield. Then this
method is used to optimize for both yearly yield for irradiation conditions
as they occur in the Netherlands and standard test conditions. It turns out
that yearly optimization can be realized at fewer bus bars and a much lower
number of fingers. The total yield is improved by .1 %. 6 figs., 5 tabs., 6
refs.
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