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ECN publication
Title:
Light and current induced degradation in p-type multi-crystalline cells and development of an inspection method and a stabilization method
 
Author(s):
Broek, K.M.; Bennett, I.J.; Jansen, M.J.; Borg, N.J.C.M. van der; Eerenstein, W.
 
Published by: Publication date:
ECN Solar Energy 24-9-2012
 
ECN report number: Document type:
ECN-M--12-053 Conference Paper
 
Number of pages: Full text:
5 Download PDF  

Abstract:
Stable solar cells are needed for durability testing of different combinations of module materials. In such a test, significant power losses in full-size modules with multi-crystalline cells after thermal cycling have been observed. This has been related to degradation of the solar cells used and it appeared that this was caused by current induced degradation. This phenomenon is not limited to boron doped Cz-Si, but can also occur in p-type multi-crystalline silicon. Work was done to develop an incoming inspection method for new batches of cells. Also, stabilisation procedures for modules containing cells that are sensitive to degradation have been determined.


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